[ale] harddrive errors
John Wells
jb at sourceillustrated.com
Sun Jun 5 20:22:30 EDT 2005
Jim Philips said:
> Seagate, like other hard drive manufacturers, offers diagnostic software
that
> you can download and use to find out exactly what is happening with your
disk:
>
> http://www.seagate.com/support/seatools/
>
Ok...ran the Seagate Diagnostic "full" test and the drive passed with no
errors. Is this a sufficient guarantee that the drive is good? I don't
want to miss out on being able to return it if it's not. For further
information, here's what S.M.A.R.T has to say about it:
----------------------------
$ sudo smartctl -a /dev/hda
smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: ST3120026A
Serial Number: 5JT5H6NQ
Firmware Version: 8.01
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2
Local Time is: Sun Jun 5 20:10:19 2005 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection:
Enabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has
ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 068 062 006 Pre-fail Always
- 109071597
3 Spin_Up_Time 0x0003 096 096 000 Pre-fail Always
- 0
4 Start_Stop_Count 0x0032 100 100 020 Old_age Always
- 0
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always
- 0
7 Seek_Error_Rate 0x000f 066 060 030 Pre-fail Always
- 4123130
9 Power_On_Hours 0x0032 100 100 000 Old_age Always
- 543
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always
- 0
12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always
- 21
194 Temperature_Celsius 0x0022 037 040 000 Old_age Always
- 37
195 Hardware_ECC_Recovered 0x001a 068 062 000 Old_age Always
- 109071597
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always
- 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline
- 0
202 TA_Increase_Count 0x0032 100 253 000 Old_age Always
- 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 519 hours (21 days + 15 hours)
When the command that caused the error occurred, the device was active
or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 32 ec 12 e0 Error: UNC 8 sectors at LBA = 0x0012ec32 = 1240114
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 32 ec 12 e0 00 18:59:19.206 READ DMA EXT
35 00 08 fa 36 f9 e0 00 18:59:18.933 WRITE DMA EXT
35 00 08 fa 14 fe e0 00 18:59:18.912 WRITE DMA EXT
35 00 88 72 14 fe e0 00 18:59:18.909 WRITE DMA EXT
35 00 08 0a c8 bf e0 00 18:59:18.892 WRITE DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 540
-
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
More information about the Ale
mailing list